Pangu TDI sequence-function strobe imaging system

Pangu TDI sequence-function strobe imaging system


More accurate, Faster, More Reliable

Applications Visual inspection of display modules
Lithium battery appearance defect detection
Print character and defect detection
Inspection of wafers and solar panels
There are many potential industry applications to be identified...



 



During in-line scan inspection, the camera outputs multiple sets of signals successively at high
rates in a cyclic manner; the light controller responds at highspeed and switches the lights on
and off successively. The Pangu TDI sequence-function strobe imaging system helps reduce
equipment space, save costs, and greatly improve inspection efficiency. The camera then splices
the received images of multiple sets of signals respectively, thereby enabling one station to
function as if it's a combination of several stations.

WorkFlow
Comparison of inspection stations


Application Cases





Case I (visual inspection of display modules)




Case II (visual inspection of lithium battery pole piece)



Case III (visual inspection of wafer)







Description of camera model code



Basic data of camera
1. 8320*16 pixels, using TDI technology (4 lines/lamp)
2. Pixel size: 5 um * 5 um
3. Support light-assisted sequence-function imaging of up to4 channels
4.2 Line frequency in 2-channel mode: 50 kHz per channel Line frequency in 3-channel mode: 33 kHz per channel Line frequency in 4-channel mode: 25 kHz per channel


Description of controller model code


                                                                                                                                                                                                                                                                                                                   



 

Controller specifications









 

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